Dual-use

Keithley 2600 Series Source Meter, ±100 mV → ±40 V, 2-Channel, ±100 nA → ±10 A, 40 W Output

RS Stock No.: 768-3400Brand: KeithleyManufacturers Part No.: 2604B
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Technical Document

Specifications

Series

2600

Source Meter Function

Current Resistance Voltage Measure, Current Voltage Source

Number of Channels

2

Source Voltage Range

±100 mV → ±40 V

Source Current Range

±100 nA → ±10 A

Output Power

40 W

Resistance Measurement Range

500 nΩ → 40 TΩ

Country of Origin

China

Product details

Keithley Source Meter Series 2600B

Series 2600B Source Meter current/voltage source and measurement instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B Source Meter models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.

Features and Benefits:

• 4-quadrant voltage/current source and measure with 6 digit resolution (2-line VFD display)
• Choose model from series offering exceptional dynamic range, 10A pulse to 0.1fA and 200V to 100nV
• Built-in Java-based test software
• Test Script Processing (TSP) technology embeds complete test programs for best-in-class system-level throughput
• TSP-Link expansion technology for multi-channel parallel test without a mainframe
• USB 2.0, LXI-C, GPIB, RS-232 and digital I/O interfaces
• Software drivers and development/debug tools supplied
• Model choice includes lower specification (2604B, 2614B, 2634B) instruments

Typical Applications:

• Semiconductor Structures
- Wafers / Thin films
• Nanomaterials and Devices
- Graphene / Carbon Nanotubes/ Nanowires /Low Power nanostructures
• Discrete and Passive Components
- Resistors / diodes / Zener Diodes / LEDs, disk drive heads, sensors
- small signal bipolar junction transistors (BJT’s), Field Effective Transistors
(FET’s)
• Organic Materials and Devices
- E-links / Printable Electronics
• Material Characterization
- Resistivity / Hall Effect

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EGP 1,387,860.47

Each (ex VAT)

Keithley 2600 Series Source Meter, ±100 mV → ±40 V, 2-Channel, ±100 nA → ±10 A, 40 W Output

EGP 1,387,860.47

Each (ex VAT)

Keithley 2600 Series Source Meter, ±100 mV → ±40 V, 2-Channel, ±100 nA → ±10 A, 40 W Output
Stock information temporarily unavailable.

Technical Document

Specifications

Series

2600

Source Meter Function

Current Resistance Voltage Measure, Current Voltage Source

Number of Channels

2

Source Voltage Range

±100 mV → ±40 V

Source Current Range

±100 nA → ±10 A

Output Power

40 W

Resistance Measurement Range

500 nΩ → 40 TΩ

Country of Origin

China

Product details

Keithley Source Meter Series 2600B

Series 2600B Source Meter current/voltage source and measurement instruments are built from Keithley's 3rd generation SMU technology. Each tightly integrated instrument offers the capabilities of a precision power supply, true current source, 6 digit DMM, arbitrary waveform generator, pulse generator and electronic load. Series 2600B Source Meter models feature built-in Java-based test software which enables true plug & play I/V characterisation through any browser, on any computer, from anywhere in the world. Series 2600B is a family of powerful instruments with unique capabilities in testing components and devices across many applications including R&D, production test, education and QA/FA.

Features and Benefits:

• 4-quadrant voltage/current source and measure with 6 digit resolution (2-line VFD display)
• Choose model from series offering exceptional dynamic range, 10A pulse to 0.1fA and 200V to 100nV
• Built-in Java-based test software
• Test Script Processing (TSP) technology embeds complete test programs for best-in-class system-level throughput
• TSP-Link expansion technology for multi-channel parallel test without a mainframe
• USB 2.0, LXI-C, GPIB, RS-232 and digital I/O interfaces
• Software drivers and development/debug tools supplied
• Model choice includes lower specification (2604B, 2614B, 2634B) instruments

Typical Applications:

• Semiconductor Structures
- Wafers / Thin films
• Nanomaterials and Devices
- Graphene / Carbon Nanotubes/ Nanowires /Low Power nanostructures
• Discrete and Passive Components
- Resistors / diodes / Zener Diodes / LEDs, disk drive heads, sensors
- small signal bipolar junction transistors (BJT’s), Field Effective Transistors
(FET’s)
• Organic Materials and Devices
- E-links / Printable Electronics
• Material Characterization
- Resistivity / Hall Effect

Keithley Power Supplies